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Atomic Force Microscope in Material Research Laboratory.

Atomic-Force Microscopy (AFM) data: Are these images real?

Focusing on atomic-force microscopy (AFM) data, Nancy A. Burnham examines the challenges in image processing for scientific research, highlighting how different techniques yield varied images and clearer views of key features. The choices researchers make during processing can therefore lead to differing conclusions, underscoring the importance of critical evaluation in scientific publications.

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